Sample preparation handbook for transmission electron microscopy : techniques
Contributor(s): Anderson, Ron, fore.
Material type: BookPublisher: New York Springer 2010Description: xxv, 338p.ISBN: 9781441959744.Subject(s): Electron microscopyDDC classification: 502.825 | Sa47Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | PK Kelkar Library, IIT Kanpur | General Stacks | 502.825 Sa47 (Browse shelf) | Available | A169792 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
502.825 P376H HIGH-ENERGY ELECTRON DIFFERACTION AND MICROSCOPY | 502.825 P954S SCANNING AUGER ELECTRON MICROSCOPY | 502.825 R274S2 SCANNING ELECTION MICROSCOPY | 502.825 Sa47 Sample preparation handbook for transmission electron microscopy | 502.825 SC63 SCANNING PROBE MICROSCOPY | 502.825 SC63 SCANNING PROBE MICROSCOPY | 502.825 SC63M SCANNING MICROSCOPY FOR NANOTECHNOLOGY |
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