Emerging nanotechnologies : test, defect tolerance and reliability
By: .
Contributor(s): Tehranipoor, Mohammad, Ed.
Material type:
BookSeries: Frontiers In Electronic Testing / Edited By Vishwani Agrawal No.37. Publisher: New York Springer 2008Description: xii, 405p.ISBN: 9780387747460.Subject(s): NanotechnologyDDC classification: 620.5 | Em32
| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 620.5 Em32 (Browse shelf) | Book Request | Available | A167523 |
Total holds: 0
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| 620.5 C493a Atomic structure prediction of nanostructures, clusters and surfaces | 620.5 D262l Lessons from nanoelectronics | 620.5 Ed98n The nanotech pioneers | 620.5 Em32 Emerging nanotechnologies | 620.5 EN11 ENABLING TECHNOLOGY FOR MEMS AND NANODEVICES | 620.5 G341p Photoemission from optoelectronic materials and their nanostructures | 620.5 H463p Photonics of quantum-dot nanomaterials and devices |
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