Transient-induced latchup in CMOS integrated circuits
By: Ker, Ming-Dou.
Contributor(s): Hsu, Sheng-Fu.
Material type:
BookPublisher: Singapore John Wiley & Sons 2009Description: xiii, 249p.ISBN: 9780470824078.Subject(s): Metal oxide semiconductors, complimentary defectsDDC classification: 621.395 | K45t
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | General Stacks | 621.395 K45t (Browse shelf) | Available | A166087 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
| 621.395 IN8V VLSI DESIGN '96 | 621.395 J175i2 Introduction to microelectronic fabrication | 621.395 K18o Operational amplifier noise | 621.395 K45t Transient-induced latchup in CMOS integrated circuits | 621.395 K559a Advanced FPGA design | 621.395 K962v VLSI ARRAY PROCESSORS | 621.395 L492H HOT-CARRIER RELIABILITY OF MOS VLSI CIRCUITS |
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