In-situ electron microscopy at high resolution
By: .
Contributor(s): Banhart, Florian, Ed.
Material type:
BookPublisher: New Jersey World Scientific 2008Description: vi, 311p.ISBN: 9789812797339.Subject(s): Electron microscopyDDC classification: 502.825 | In1
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | General Stacks | 502.825 In1 (Browse shelf) | Available | A164746 |
Total holds: 0
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| 502.825 C76 ELECTRON MICROSCOPY AND ANALYSIS | 502.825 EG28P PHYSICAL PRINCIPLES OF ELECTRON MICROSCOPY | 502.825 G618f Thin foil preparation for electron microscopy | 502.825 In1 In-situ electron microscopy at high resolution | 502.825 K299 Kelvin probe force microscopy | 502.825 L95 Low voltage electron microscopy | 502.825 M576S SCANNING PROBE MICROSCOPY |
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