Applied scanning probe methods X : biomimetics and industrial applications
By: .
Contributor(s): Bhushan, Bharat,Ed.
Material type:
BookSeries: Nanoscience And Technology/Edited By P. Avouris. Publisher: Berlin Springer 2008Description: xxxvi, 427p.ISBN: 9783540740841.Subject(s): Scanning Probe MicroscopyDDC classification: 502.82 | Ap58
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | General Stacks | 502.82 Ap58 (Browse shelf) | Available | A162783 |
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| 502.8 R589i AN INTRODUCTION TO MICROSCOPY BY MEANS OF LIGHT, ELECTRONS, X-RAYS , OR ULTRASOUND | 502.8 W462 SCANNING ELECTRON MICROSCOPY | 502.8 W462 SCANNING ELECTRON MICROSCOPY | 502.82 Ap58 Applied scanning probe methods X | 502.82 AT71 ATOMIC FORCE MICROSCOPY IN ADHESION STUDIES | 502.82 B745M MATERIALS ANALYSIS USING A NUCLEAR MICROPROBE | 502.82 C421i2 Introduction to scanning tunneling microscopy |
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