ADVANCED SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
By: Newbury,Dale E.
Material type:
BookPublisher: Kluwer Academic / Plenum Publishers,New York 1986Description: xii,454.ISBN: 0306421402.Subject(s): Scanning Electron Microscope | X-Ray Microanalysis | Electron Probe MicroanalysisDDC classification: 502.825 | AD95
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | General Stacks | 502.825 AD95 (Browse shelf) | Available | A157250 |
Total holds: 0
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| 502.82 W950m Microscope image processing | 502.82 X79 X-ray microscopy and spectromicroscopy | 502.825 Ab37 Aberration-corrected analytical transmission electron microscopy | 502.825 AD95 ADVANCED SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS | 502.825 B976d DYNAMIC EXPERIMENTS IN THE ELECTRON MICROSCOPE | 502.825 C76 ELECTRON MICROSCOPY AND ANALYSIS | 502.825 EG28P PHYSICAL PRINCIPLES OF ELECTRON MICROSCOPY |
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