ATOMIC FORCE MICROSCOPY IN ADHESION STUDIES
By: Drelich,Jaroslaw.
Contributor(s): Mittal,Kash L.
Material type:
BookPublisher: Vsp, Leiden 2005Description: x,811.ISBN: 90 6764 434 X.Subject(s): Atomic Force Microscopy | AdhesionDDC classification: 502.82 | AT71
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | General Stacks | 502.82 AT71 (Browse shelf) | Available | A156874 |
Total holds: 0
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| 502.8 W462 SCANNING ELECTRON MICROSCOPY | 502.8 W462 SCANNING ELECTRON MICROSCOPY | 502.82 Ap58 Applied scanning probe methods X | 502.82 AT71 ATOMIC FORCE MICROSCOPY IN ADHESION STUDIES | 502.82 B745M MATERIALS ANALYSIS USING A NUCLEAR MICROPROBE | 502.82 C421i2 Introduction to scanning tunneling microscopy | 502.82 C874u Under the microscope |
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