SCANNING PROBE MICROSCOPY
By: Kalinin,Sergei.
Contributor(s): Gruverman,Alexei.
Material type:
BookPublisher: Springer Science+Business Media Inc., New York 2007Description: 2v.ISBN: 0387286675.Subject(s): Scanning Probe Microscopy | NanoelectronicsDDC classification: 502.825 | SC63
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | General Stacks | 502.825 SC63 (Browse shelf) | Available | A157367 |
Total holds: 0
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| 502.825 R274S2 SCANNING ELECTION MICROSCOPY | 502.825 Sa47 Sample preparation handbook for transmission electron microscopy | 502.825 SC63 SCANNING PROBE MICROSCOPY | 502.825 SC63 SCANNING PROBE MICROSCOPY | 502.825 SC63M SCANNING MICROSCOPY FOR NANOTECHNOLOGY | 502.825 Sca63 Scanning transmission electron microscopy of nanomaterials | 502.825 W341P2 PRINCIPLES AND PRACTICE OF ELECTRON MISCROSCOPY |
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