ANAMALOUS X-RAY SCATTERING FOR MATERIALS CHARACTERIZATION
By: Waseda,Yoshio.
Material type: BookSeries: Springer Tracts In Modern Physics V. 179. Publisher: Springer-Verlag, Berlin 2002Description: xiii,214.ISBN: 3540434437.Subject(s): X-Rays -- Scattering | X-Ray CrystallographyDDC classification: 548.83 | W269AItem type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | PK Kelkar Library, IIT Kanpur | General Stacks | 548.83 W269A (Browse shelf) | Available | A151906 |
Total holds: 0
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548.83 W251x X-RAY DIFFRACTION | 548.83 W251x X-RAY DIFFRACTION | 548.83 W251x X-Ray diffraction | 548.83 W269A ANAMALOUS X-RAY SCATTERING FOR MATERIALS CHARACTERIZATION | 548.83 W691e ELEMENTS OF X-RAY CRYSTALLOGRAPHY | 548.83 W884i INTRODUCTION TO X-RAY CRYSTALLOGRAPHY | 548.83 W889d DIFFUSE X-RAY REFLECTIONS FROM CRYSTALS |
Includes Bibliographical References And Index
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