INTRODUCTION TO FOCUSED ION BEAMS
By: Giannuzzi,Lucille A.
Contributor(s): Stevie,Fred A.
Material type: BookPublisher: Springer Science+Business Media Inc., New York 2005Description: xiv,357.ISBN: 0387231161.Subject(s): Focused Ion Beams | SemiconductorsDDC classification: 621.38152 | IN8FItem type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | PK Kelkar Library, IIT Kanpur | General Stacks | 621.38152 IN8F (Browse shelf) | Available | A153509 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
621.38152 Id26 Identification of defects in semiconductors | 621.38152 Ih4s Semiconductor nanostructures | 621.38152 In88 Into the nano era | 621.38152 IN8F INTRODUCTION TO FOCUSED ION BEAMS | 621.38152 In8i INSULATING FILMS ON SEMICONDUCTORS | 621.38152 Io6 IONIZING RADIATION EFFECTS IN MOS DEVICES AND CIRCUITS | 621.38152 Io6 Ion beams in nanoscience and technology |
There are no comments for this item.