SAMPLING, WAVELETS, AND TOMOGRAPHY
By: Benedetto,John J.
Contributor(s): Zayed,Ahmed I.
Material type:
BookSeries: Applied And Numerical Harmonic Analysis. Publisher: Birkhauser, Boston 2004Description: xxi,344.ISBN: 0817643044.Subject(s): Wavelets (Mathematics) | Sampling | Harmonic AnalysisDDC classification: 515.2433 | SA47
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
|
PK Kelkar Library, IIT Kanpur | General Stacks | 515.2433 SA47 (Browse shelf) | Available | A147678 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
| 515.2433 R278C CLASSICAL HARMONIC ANALYSIS AND LOCALLY COMPACT GROUPS | 515.2433 R312W WAVELET ANALYSIS | 515.2433 R827w Wavelet theory | 515.2433 SA47 SAMPLING, WAVELETS, AND TOMOGRAPHY | 515.2433 Sch44t TOPICS IN FOURIER ANALYSIS AND FUNCTION SPACES | 515.2433 Se52r Recent progress in Fourier analysis | 515.2433 Sh22f Fourier series in several variables with applications to partial differential equations |
Includes Bibliographical References And Index
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