SCANNING PROBE MICROSCOPY
By: Meyer,Ernst,Hug,Hans Josef.
Contributor(s): Bennewitz,Roland.
Material type:
BookPublisher: Springer-Verlag,Berlin 2004Description: x,210.ISBN: 3540431802.Subject(s): Scanning Probe MicroscopyDDC classification: 502.825 | M576S
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
|
PK Kelkar Library, IIT Kanpur | General Stacks | 502.825 M576S (Browse shelf) | Available | A146608 |
Total holds: 0
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| 502.825 In1 In-situ electron microscopy at high resolution | 502.825 K299 Kelvin probe force microscopy | 502.825 L95 Low voltage electron microscopy | 502.825 M576S SCANNING PROBE MICROSCOPY | 502.825 M914I2 INTRODUCTION TO CONFOCAL FLUORESCENCE MICROSCOPY | 502.825 P376H HIGH-ENERGY ELECTRON DIFFERACTION AND MICROSCOPY | 502.825 P954S SCANNING AUGER ELECTRON MICROSCOPY |
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