RF MEASUREMENTS OF DIE AND PACKAGES
By: Wartenberg,Scott A.
Material type:
BookPublisher: Artech House, Boston c2002Description: xv,224.ISBN: 158053273X.Subject(s): Integrated Circuits -- Testing | Radio Circuits -- TestingDDC classification: 621.3815 | W264R
| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.3815 W264R (Browse shelf) | Book Request | Available | A142598 |
Total holds: 0
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| 621.3815 V586S SIMULATION TECHNIQUES AND SOLUTIONS FOR MIXED-SIGNAL COUPLING IN INTEGRATED CIRCUITS | 621.3815 V691p Piezoelectric materials and devices | 621.3815 W184O ON-CHIP ESD PROTECTION FOR INTEGRATED CIRCUITS | 621.3815 W264R RF MEASUREMENTS OF DIE AND PACKAGES | 621.3815 W26s SEMICONDUCTORS AND TRANSISTORS | 621.3815 W26s Semiconductors and transistors | 621.3815 W26s SEMICONDUCTORS AND TRANSISTORS |
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