Scanning probe microscopy : analytical methods
Contributor(s): R. Wiesendanger, ed.
Material type:
BookPublisher: Berlin Springer-Verlag 1998Description: xi,216p.ISBN: 3540638156.Subject(s): Scanning Probe MicroscopyDDC classification: 502.82 | SC63
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | General Stacks | 502.82 SC63 (Browse shelf) | Available | A138517 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
| 502.82 M951f2 Fundamentals of light microscopy and electronic imaging | 502.82 R272f Fundamentals of atomic force microscopy | 502.82 R273t TRANSMISSION ELECTRON MICROSCOPY | 502.82 SC63 Scanning probe microscopy | 502.82 SC63P SCANNING PROBE MICROSCOPIES BEYOND IMAGING | 502.82 SCI27 SCIENCE OF MICROSCOPY | 502.82 W950m Microscope image processing |
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