CHARACTERIZATION OF RADIATION DAMAGE BY TRANSMISSION ELECTRON MICROSCOPY
By: Jenkins,M. L.
Contributor(s): Kirk,M. A.
Material type:
BookSeries: Series In Microscopy In Materials Science. Publisher: Institute Of Physics, Bristol c2001Description: x,224.ISBN: 0 7503 0748 X.Subject(s): Materials -- Effect Of Radiation On- | Materials -- Microscopy | Transmission Electron MicroscopyDDC classification: 620.11228 | J417C
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | General Stacks | 620.11228 J417C (Browse shelf) | Available | A138217 |
Total holds: 0
Includes Bibliographical References And Index
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