PLASMA CHARGING DAMAGE.
By: Cheung,Kin P.
Material type:
BookPublisher: Springer-Verlag, London 2001Description: xii,346.ISBN: 1852331445.Subject(s): Semicoductors -- Effect Of Radiation On | Metal Oxide Semiconductors -- Defects | Plasma RadiationDDC classification: 621.044 | C426
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | General Stacks | 621.044 C426 (Browse shelf) | Available | A138135 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
| 621.04203 B299p Power plant instrumentation and control handbook | 621.044 Ad95r Advanced plasma technology | 621.044 C421L LECTURE NOTES ON PRINCIPLES OF PLASMA PROCESSING | 621.044 C426 PLASMA CHARGING DAMAGE. | 621.044 H192S HANDBOOK OF ADVANCED PLASMA PROCESSING TECHNIQUES | 621.044 L333r LASER-INDUCED PLASMAS AND APPLICATIONS | 621.044 M289P PLASMA ELECTRONICS |
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