TRANSMISSION ELECTRON MICROSCOPY AND DIFFRACTOMETRY OF MATERIALS
By: Fultz,Brent.
Contributor(s): Howe,James.
Material type:
BookPublisher: Springer-Verlag, Berlin c2001Description: xix,748.ISBN: 3540678417.Subject(s): Materials -- Microscopy | Transmission Electron Microscopy | X-Ray DiffractometerDDC classification: 620.11299 | F959T
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | General Stacks | 620.11299 F959T (Browse shelf) | Available | A134774 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
| 620.11299 EL25 ELECTRON MICROSCOPY | 620.11299 EL25S ELECTRON BACKSCATTER DIFFRACTION IN MATERIALS SCIENCE | 620.11299 F639G GRAIN BOUNDARIES | 620.11299 F959T TRANSMISSION ELECTRON MICROSCOPY AND DIFFRACTOMETRY OF MATERIALS | 620.11299 H426M METASTABLE SOLIDS FROM UNDERCOOLED MELTS | 620.11299 IN2 INDUSTRIAL APPLICATIONS OF ELECTRON MICROSCOPY | 620.11299 K967Q QUANTITATIVE DESCRIPTION OF THE MICROSTRUCTURE OF MATERIALS. |
Includes Bibliographical References And Index
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