THIN FLIM ANALYSIS BY X-RAYS SCATTERING
By: Birkholz,Mario.
Material type:
BookPublisher: Wiley-Vch Verlag Gmbh & Co. Kgaa, Weinheim 2006Description: xxii,356.ISBN: 3527310525.Subject(s): Thin Flims | X-Ray SpectroscopyDDC classification: 530.4275 | B535T
| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 530.4275 B535T (Browse shelf) | Book Request | Available | A154608 |
Total holds: 0
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| 530.427 SU77O SURFACE SCIENCE | 530.4275 AL28F cop.1 FUNDAMENTALS OF NANOSCALE FILM ANALYSIS | 530.4275 AL28F cop.2 FUNDAMENTALS OF NANOSCALE FILM ANALYSIS | 530.4275 B535T THIN FLIM ANALYSIS BY X-RAYS SCATTERING | 530.4275 D837 DROPS AND BUBBLES IN INTERFACIAL RESEARCH | 530.4275 F962 FUNCTIONAL THIN FLIMS AND FUNCTIONAL MATERIALS | 530.4275 K528W WAVEGUIDE SPECTROSCOPY OF THIN FILMS |
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