IN SITU REAL - TIME CHARACTERIZATION OF THIN FILMS
By: Orlando, Auciello, Alan R Krauss.
Contributor(s): Krauss,Alan R.
Material type:
BookPublisher: John Wiley, New York 2001Description: xi,263.ISBN: 0471241415.Subject(s): Thin FilmsDDC classification: 530.4275 | IN2
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | General Stacks | 530.4275 IN2 (Browse shelf) | Available | A133206 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
| 530.427 G89t2 Theoretical surface science | 530.427 L95 LOW ENERGY ION-SURFACE INTERACTIONS | 530.427 P43l Liquid surfaces and interfaces | 530.4275 IN2 IN SITU REAL - TIME CHARACTERIZATION OF THIN FILMS | 530.4275 IN8H TRENDS AND NEW APPLICATIONS OF THIN FILMS | 530.4275 M919 MULTILAYER THIN FILMS | 530.4275 M919t2 Multilayer thin films [2 v.] |
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