SEMICONDUCTOR MEASUREMENTS AND INSTRUMENTATION
By: Runyan,W R.
Contributor(s): Shaffer,T J.
Material type:
BookPublisher: Mcgraw-Hill, New York 1998Edition: 2nd.Description: x,454.ISBN: 0070576971.Subject(s): Semiconductors | Physical MeasurementsDDC classification: 621.381520287 | R876S
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | General Stacks | 621.381520287 R876S (Browse shelf) | Available | A127412 |
Total holds: 0
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| 621.38152015 J15m MONTE CARLO METHOD FOR SEMICONDUCTOR DEVICE SIMULATION | 621.381520151 M342s STATIONARY SEMICONDUCTOR DEVICE EQUATIONS | 621.38152028 W468 ION BEAMS | 621.381520287 R876S SEMICONDUCTOR MEASUREMENTS AND INSTRUMENTATION | 621.381522 H537 Highly efficient OLEDs with phosphorescent materials | 621.381522 K119O ORGANIC ELECTROLUMINESCENCE | 621.381522 K124o Organic light-emitting diodes |
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