ANALOG SIGNAL GENERATION FOR BUILT-IN-SELF-TEST OF MIXED-SIGNAL INTEGRATED CIRCUITS
By: Roberts,Gordon W.
Contributor(s): Lu,Albert K.
Material type:
BookPublisher: Kluwer Academic Publishers, Boston c1995Description: viii,122.ISBN: 0792395646.Subject(s): Signal Generators -- Design And Construction | Integrated Circuits -- Testing | Signal Processing -- Digital TechniquesDDC classification: 621.381548 | R542A
| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Books
|
PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.381548 R542A (Browse shelf) | Book Request | Available | A124834 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: COMPACT STORAGE (BASEMENT) Close shelf browser
| 621.381548 M866P PRINCIPLES OF TESTING ELECTRONIC SYSTEMS | 621.381548 P871t TESTING ACTIVE AND PASSIVE ELECTRONIC COMPONENTS | 621.381548 R259c CATHODE RAY OSCILLOSCOPE | 621.381548 R542A ANALOG SIGNAL GENERATION FOR BUILT-IN-SELF-TEST OF MIXED-SIGNAL INTEGRATED CIRCUITS | 621.381548 St76a ATE | 621.381548 T233m Test and diagnosis for small-delay defects | 621.381548 T233n Nanometer technology designs high-quality delay tests |
Includes Bibliographical References And Index
There are no comments for this item.