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INTRODUCTION TO VLSI TESTING

By: Feugate, Robert J.
Contributor(s): Mcintyre, Steven M.
Material type: materialTypeLabelBookPublisher: Englewood Cliffs Prentice Hall 1988Description: xiii,226.ISBN: 0134988663.Subject(s): Integrated Circuits -- Very Large Scale Integration -- TestingDDC classification: 621.38173 | F434i
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Item type Current location Collection Call number url Status Date due Barcode Item holds
Books Books PK Kelkar Library, IIT Kanpur
COMPACT STORAGE (BASEMENT) 621.38173 F434i (Browse shelf) Book Request Available A102695
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: COMPACT STORAGE (BASEMENT) Close shelf browser
621.38173 D492 DEVELOPMENTS IN INTEGRATED CIRCUIT TESTING 621.38173 D569 DIGITAL MOS INTEGRATED CIRCUITS 621.38173 F418u ULTRA LARGE SCALE INTEGRATED MICROEL-ECTRONICS 621.38173 F434i INTRODUCTION TO VLSI TESTING 621.38173 F556 ELECTRONIC INTEGRATED CIRCUITS AND SYSTEMS 621.38173 F87sd SYSTEMS DESIGN WITH ADVANCED MICROPROCESSORS 621.38173 G11i GAAS INTEGRATED CIRCUITS

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