INTRODUCTION TO VLSI TESTING
By: Feugate, Robert J.
Contributor(s): Mcintyre, Steven M.
Material type: BookPublisher: Englewood Cliffs Prentice Hall 1988Description: xiii,226.ISBN: 0134988663.Subject(s): Integrated Circuits -- Very Large Scale Integration -- TestingDDC classification: 621.38173 | F434iItem type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
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Books | PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38173 F434i (Browse shelf) | Book Request | Available | A102695 |
Total holds: 0
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621.38173 D492 DEVELOPMENTS IN INTEGRATED CIRCUIT TESTING | 621.38173 D569 DIGITAL MOS INTEGRATED CIRCUITS | 621.38173 F418u ULTRA LARGE SCALE INTEGRATED MICROEL-ECTRONICS | 621.38173 F434i INTRODUCTION TO VLSI TESTING | 621.38173 F556 ELECTRONIC INTEGRATED CIRCUITS AND SYSTEMS | 621.38173 F87sd SYSTEMS DESIGN WITH ADVANCED MICROPROCESSORS | 621.38173 G11i GAAS INTEGRATED CIRCUITS |
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