PHOTOINDUCED DEFECTS IN SEMICONDUCTORS
By: Redfield,David.
Contributor(s): Bube,Richard H.
Material type:
BookSeries: Cambridge Studies In Semiconductor Physics And Microelectronic Engineering. Publisher: Cambridge Univ. Press, Cambridge c1996Description: x,217.ISBN: 0521461960.Subject(s): Semiconductors -- Defects | PhotochemistryDDC classification: 621.38152 | R247P
| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38152 R247P (Browse shelf) | Book Request | Available | A122285 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: COMPACT STORAGE (BASEMENT) Close shelf browser
| 621.38152 R182 Rare earth oxide thin films | 621.38152 R219O OPTOELECTRONIC DEVICES | 621.38152 R22 Reactive sputter deposition | 621.38152 R247P PHOTOINDUCED DEFECTS IN SEMICONDUCTORS | 621.38152 R252S SILICON PHOTONICS | 621.38152 R279 RALIABILITY AND DEGRADATION | 621.38152 R39 THE ROLE OF MICROSCOPY IN SEMICONDUCTOR FAILURE ANALYSIS |
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