TESTING SEMICONDUCTOR MEMORIES
By: Goor, A. J. Van De.
Material type:![materialTypeLabel](/opac-tmpl/lib/famfamfam/BK.png)
Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38152 G643t (Browse shelf) | Book Request | Available | A113421 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: COMPACT STORAGE (BASEMENT) Close shelf browser
621.38152 G341e Einstein relation in compound semiconductors and their nanostructures | 621.38152 G449o ORIENTED CRYSTALLIZATION ON AMORPHOUS SUBSTRACTS | 621.38152 G519 GLOW DISCHARGE OF HYDROGENATED AMORPHOUS SILICON | 621.38152 G643t TESTING SEMICONDUCTOR MEMORIES | 621.38152 G758M2 METAL IMPURITIES IN SILICON-DEVICE FABRICATION | 621.38152 G919p PHYSICS AND TECHNOLOGY OF SEMICONDUCTOR DEVICES | 621.38152 G919p PHYSICS AND TECHNOLOGY OF SEMICONDUCTOR DEVICES |
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