TESTING AND DIAGNOSIS OF ANALOG CIRCUITS AND SYSTEMS
By: Liu, Ruey-Wen.
Material type:
BookPublisher: New York Van Nostrand Reinhold c1991Description: xiv,248.ISBN: 0442259328.Subject(s): Analog Electronic Systems -- TestingDDC classification: 621.38195735 | T288d
| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38195735 T288d (Browse shelf) | Book Request | Available | A113626 |
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| 621.38195735 An13d DATA ACQUISITION PRODUCTS CATALOG | 621.38195735 G798 ANALOG INTEGRATED CIRCUIT DESIGN | 621.38195735 G798 ANALOG INTEGRATED CIRCUIT DESIGN | 621.38195735 T288d TESTING AND DIAGNOSIS OF ANALOG CIRCUITS AND SYSTEMS | 621.381958 AL25 MICROCIRCUIT LEARNING COMPUTERS | 621.381958 Am35 COLLECTION OF TECHNICAL PAPERS | 621.381958 Am35c CHARACTERISTICS OF CURRENT DIGITAL COMPUTERS |
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