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Proceedings of the Sixth International Conference on X-Ray Optics and Microanalysis

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BookPublisher: Japan University Of Tokyo Press 1972Description: xi, 904p.DDC classification: 537.535 | In2

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Item type	Current location	Collection	Call number	url	Status	Date due	Barcode	Item holds
Books	PK Kelkar Library, IIT Kanpur	COMPACT STORAGE (BASEMENT)	537.535 In2 (Browse shelf)	Book Request	Available		A61675

Total holds: 0

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Previous	537.535 G464p3 PHYSICAL FOUNDATIONS OF RADIOLOGY	537.535 G959 X-RAY DATA BOOK FOR ANALYSIS OF LAUE AND POWDER DIFFRACTION PATTERNS	537.535 G959 X-RAY DATA BOOK FOR ANALYSIS OF LAUE AND POWDER DIFFRACTION PATTERNS	537.535 In2 Proceedings of the Sixth International Conference on X-Ray Optics and Microanalysis	537.535 In2 X-RAY OPTICS AND MICROANALYSIS	537.535 P277x THIRD INTERNATIONAL SYMPOSIUM ON X-RAY OPTICS AND X-RAY MICROANALYSIS HELD AT STANFORD UNIVERSITY. AUGUST 22-24, 1962	537.535028 B669s SELECTED SCIENTIFIC PAPERS	Next

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