ATE : AUTOMATIC TEST EQUIPMENT
By: Stover, Allan C.
Material type: BookPublisher: New York Mcgraw-Hill 1984Description: xiv, 239p.Subject(s): Automatic Chackout EquipmentDDC classification: 621.381548 | St76aItem type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
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Books | PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.381548 St76a (Browse shelf) | Book Request | Available | A88840 |
Total holds: 0
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621.381548 P871t TESTING ACTIVE AND PASSIVE ELECTRONIC COMPONENTS | 621.381548 R259c CATHODE RAY OSCILLOSCOPE | 621.381548 R542A ANALOG SIGNAL GENERATION FOR BUILT-IN-SELF-TEST OF MIXED-SIGNAL INTEGRATED CIRCUITS | 621.381548 St76a ATE | 621.381548 T233m Test and diagnosis for small-delay defects | 621.381548 T233n Nanometer technology designs high-quality delay tests | 621.381548 W391E ELECTRICAL MEASUREMENT, SIGNAL PROCESSING, AND DISPLAYS |
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