SEMICONDUCTOR MEASUREMENTS AND INSTRUMENTATION
By: Runyan, W. R.
Material type:
BookSeries: Texas Instruments Electronics Series. Publisher: New York Mcgraw-Hill 1975Description: 280.Subject(s): SemiconductorsDDC classification: 621.38153042 | R876s
| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38153042 R876s (Browse shelf) | Book Request | Available | A52660 |
Total holds: 0
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| 621.38153042 M85n MOS AND SPECIAL-PURPOSE BIPOLAR INTEGRATED CIRCUITS AND R-F POWER TRANSISTOR CIRCUIT DESIGN | 621.38153042 R498 SEMICONDUCTOR CIRCUITS | 621.38153042 R498 SEMICONDUCTOR CIRCUITS | 621.38153042 R876s SEMICONDUCTOR MEASUREMENTS AND INSTRUMENTATION | 621.381530422 C839 TRANSISTOR CIRCUITS AND APPLICATIONS | 621.381530422 C839 TRANSISTOR CIRCUITS AND APPLICATIONS | 621.381530422 F333 PHYSICS AND CIRCUIT PROPERTIES OF TRANSISTORS |
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