ADVANCES IN ANALYSIS OF MICROSTRUCTURAL FEATURES
By: Electron-Beam Techniques.
Material type:![materialTypeLabel](/opac-tmpl/lib/famfamfam/BK.png)
Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 535.3325 Ad95 (Browse shelf) | Book Request | Available | A59723 |
Total holds: 0
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535.33 P569 V.9 PHYSICS OF THIN FILMS | 535.33 T212o OPTICAL TRANSFORMS | 535.33 W86l LASER DAMAGE IN OPTICAL MATERIALS | 535.3325 Ad95 ADVANCES IN ANALYSIS OF MICROSTRUCTURAL FEATURES | 535.3325 Ap58 THE APPLICATION OF ELECTRON MICROSCOPY OF MATERIALS SCIENCE | 535.3325 C361x X-RAY MICROANALYSIS IN THE ELECTROMICROSCOPE | 535.3325 D492 DEVELOPMENTS IN ELECTRON MICROSCOPY AND ANALYSIS |
Proc. Of A Two-Day Meeting Jointly Organized By The Metals Society, And The Institute Of Physics, Held At Royal Society, London, 1974
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