Thin foil preparation for electron microscopy
By: Goodhew, P. J.
Material type:![materialTypeLabel](/opac-tmpl/lib/famfamfam/BK.png)
Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
![]() |
PK Kelkar Library, IIT Kanpur | General Stacks | 502.825 G618f (Browse shelf) | Available | A97315 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
502.825 B976d DYNAMIC EXPERIMENTS IN THE ELECTRON MICROSCOPE | 502.825 C76 ELECTRON MICROSCOPY AND ANALYSIS | 502.825 EG28P PHYSICAL PRINCIPLES OF ELECTRON MICROSCOPY | 502.825 G618f Thin foil preparation for electron microscopy | 502.825 In1 In-situ electron microscopy at high resolution | 502.825 K299 Kelvin probe force microscopy | 502.825 L95 Low voltage electron microscopy |
There are no comments for this item.