Welcome to P K Kelkar Library, Online Public Access Catalogue (OPAC)

Normal view MARC view ISBD view

INTEGRATED CIRCUITS QUALITY AND RELIABILITY

By: Hnatek, Eugene R.
Material type: materialTypeLabelBookSeries: Electrical Engineering And Electronics 41. Publisher: New York Marcel Dekker 1987Description: xiii,698.Subject(s): Integrated Circuits -- ReliabilityDDC classification: 621.38173 | H649i
    average rating: 0.0 (0 votes)
Item type Current location Collection Call number url Status Date due Barcode Item holds
Books Books PK Kelkar Library, IIT Kanpur
COMPACT STORAGE (BASEMENT) 621.38173 H649i (Browse shelf) Book Request Available A98717
Total holds: 0

There are no comments for this item.

Log in to your account to post a comment.

Powered by Koha