CHARACTERIZATION OF SEMICONDUCTOR MATERIALS
By: Kane, Philip F.
Contributor(s): Larrabee, Graydon B.
Material type:
BookSeries: Taxas Instruments Electronics Series. Publisher: New York Mcgraw-Hill 1970Description: 351.Subject(s): SemiconductorsDDC classification: 621.38152 | K131c
| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38152 K131c (Browse shelf) | Book Request | Available | A59930 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: COMPACT STORAGE (BASEMENT) Close shelf browser
| 621.38152 IN8SI SILICON CARBIDE AND RELATED MATERIALS - 2002; ECSCRM 2002 | 621.38152 J641r Reliability and radiation effects in compound semiconductors | 621.38152 J832 SEMICONDUCTOR DEVICES | 621.38152 K131c CHARACTERIZATION OF SEMICONDUCTOR MATERIALS | 621.38152 K131c CHARACTERIZATION OF SEMICONDUCTOR MATERIALS | 621.38152 K133G GALLIUM ARSENIDE DIGITAL INTEGRATED CIRCUITS | 621.38152 K868P POSITRON ANNIHILATION IN SEMICONDUCTORS |
Includes Bibliography
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