EXAFS : BASIC PRINCIPLES AND DATA ANALYSIS
By: Teo, Boon K.
Material type:![materialTypeLabel](/opac-tmpl/lib/famfamfam/BK.png)
Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
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PK Kelkar Library, IIT Kanpur | General Stacks | 539.7222 T264e (Browse shelf) | Available | A91825 |
Total holds: 0
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539.7222 J176c Coherent sources of XUV radiation | 539.7222 K117h HANDBOOK OF X-RAYS, FOR DIFFRACTION, EMISSION, ABSORPTION, AND MICROSCOPY | 539.7222 L669i INTERPRETATION OF X-RAY POWDER DIFFRACTION PATTERNS | 539.7222 T264e EXAFS | 539.7222 W441d Diffuse x-ray scattering and models of disorder | 539.7223 D735 COSMIC RAYS | 539.7223 D735C COSMIC RAYS IN THE EARTH'S ATMOSPHERE AND UNDERGROUND |
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