ELECTRONIC AND INSTRUMENTACION FOR SCIENCTIETS
By: Malmstadt, Howard V.
Contributor(s): Crouch, Stanley R.
Material type:![materialTypeLabel](/opac-tmpl/lib/famfamfam/BK.png)
Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38154 M297e (Browse shelf) | Book Request | Available | A81965 |
Total holds: 0
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621.38154 F228e ELECTRONIC TESTING | 621.38154 In7b INSTABILITIES IN SILICON DEVICES | 621.38154 K958M MODERN ELECTRONIC TEST AND MEASURING INSTRUMENTS | 621.38154 M297e ELECTRONIC AND INSTRUMENTACION FOR SCIENCTIETS | 621.38154 N213 NATIONAL CONFERENCE ON INSTRUMENTATION | 621.38154 N214d DIGITAL IMAGE PROCESSING AND ANALYSIS | 621.38154 P274p PRINCIPLES OF INDUSTRIAL INSTRUMENTATION |
Bibliography : P. 527-534
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