CHARACTERIZATION OF SEMICONDUCTOR MATERIALS
By: Kane, Philip F.
Contributor(s): Larrabee, Graydon B.
Material type: BookSeries: Taxas Instruments Electronics Series. Publisher: New York Mcgraw-Hill 1970Description: 351.Subject(s): SemiconductorsDDC classification: 621.38152 | K131cItem type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | PK Kelkar Library, IIT Kanpur | General Stacks | 621.38152 K131c (Browse shelf) | Available | A9954 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
621.38152 Io6 Ion beams in nanoscience and technology | 621.38152 J199C COMPOUND SEMICONDUCTORS STRAINED LAYERS AND DEVICES | 621.38152 J299 OXIDE SEMICONDUCTORS | 621.38152 K131c CHARACTERIZATION OF SEMICONDUCTOR MATERIALS | 621.38152 K131c CHARACTERIZATION OF SEMICONDUCTOR MATERIALS | 621.38152 K133 PHYSICAL AND SOLID STATE ELECTRONICS | 621.38152 K56i Introductory quantum mechanics for semiconductor nanotechnology |
Includes Bibliography
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