FIELD-ION MIORSCOPY
By: Bowkett, K. M.
Contributor(s): Smith, D. A.
Material type:
BookSeries: Defects In Crystalline Solids, V. 2. Publisher: Amsterdam North-Holland Pub. Co. 1970Description: 257.Subject(s): Ions | Microscope And MicroscopyDDC classification: 537.56 | B679f
| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 537.56 B679f (Browse shelf) | Book Request | Available | A13305 |
Total holds: 0
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| 537.54 W69x X-RAY OPTICS | 537.54 W69x X-ray optics | 537.56 An77s Strongly correlated electron systems (Italy, 1989) | 537.56 B679f FIELD-ION MIORSCOPY | 537.56 C245I ION BOMBARDMENT OF SOLIDS | 537.56 EL25 ELECTRO-OPTICS/LASER | 537.56 El25e ELECTRO-OPTICS/LASER INTERNATIONAL' 82 UK |
Includes Bibliography
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