SCANNING ELECTRON MICROSCOPY
By: Wells, Oliver C.
Material type: BookPublisher: New York Mcgraw-Hill 1974Description: 421.Subject(s): Scanning Electron MicroscopeDDC classification: 502.8 | W462Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | PK Kelkar Library, IIT Kanpur | General Stacks | 502.8 W462 (Browse shelf) | Available | A41131 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
502.8 H323 V.2 PRINCIPLES AND TECHNIQUES OF SCANNING ELECTRON MICROSCOPY | 502.8 R589i AN INTRODUCTION TO MICROSCOPY BY MEANS OF LIGHT, ELECTRONS, X-RAYS , OR ULTRASOUND | 502.8 W462 SCANNING ELECTRON MICROSCOPY | 502.8 W462 SCANNING ELECTRON MICROSCOPY | 502.82 Ap58 Applied scanning probe methods X | 502.82 AT71 ATOMIC FORCE MICROSCOPY IN ADHESION STUDIES | 502.82 B745M MATERIALS ANALYSIS USING A NUCLEAR MICROPROBE |
Bibliography P. : 340-406
There are no comments for this item.