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Surface structure determination by LEED and X-rays (Record no. 566794)

000 -LEADER
fixed length control field 01768 a2200241 4500
003 - CONTROL NUMBER IDENTIFIER
control field OSt
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9781108418096
040 ## - CATALOGING SOURCE
Transcribing agency IIT Kanpur
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title eng
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 541.33
Item number M826s
100 ## - MAIN ENTRY--AUTHOR NAME
Personal name Moritz, Wolfgang
245 ## - TITLE STATEMENT
Title Surface structure determination by LEED and X-rays
Statement of responsibility, etc Wolfgang Moritz and Michel A. Van Hove
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Name of publisher Cambridge University Press
Year of publication 2022
Place of publication Cambridge
300 ## - PHYSICAL DESCRIPTION
Number of Pages xxxiii, 440p
520 ## - SUMMARY, ETC.
Summary, etc This timely text covers the theory and practice of surface and nanostructure determination by low-energy electron diffraction (LEED) and surface X-ray diffraction (SXRD): it is the first book on such quantitative structure analysis in over 30 years. It provides a detailed description of the theory, including cutting-edge developments and tested experimental methods. The focus is on quantitative techniques, while the qualitative interpretation of the LEED pattern without quantitative I(V) analysis is also included. Topics covered include the future study of nanoparticles, quasicrystals, thermal parameters, disorder and modulations of surfaces with LEED, with introductory sections enabling the non-specialist to follow all the concepts and applications discussed. With numerous colour figures throughout, this text is ideal for undergraduate and graduate students and researchers, whether experimentalists or theorists, in the fields of surface science, nanoscience and related technologies. It can serve as a textbook for graduate-level courses of one or two semesters.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term Low energy electron diffraction
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term Surface chemistry
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term Surfaces (Technology) -- Analysis
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term X-ray diffraction imaging
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term Chemical structure
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Van Hove, Michel A.
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Books
Holdings
Withdrawn status Lost status Damaged status Not for loan Collection code Permanent Location Current Location Date acquired Source of acquisition Cost, normal purchase price Full call number Accession Number Cost, replacement price Koha item type
        General Stacks PK Kelkar Library, IIT Kanpur PK Kelkar Library, IIT Kanpur 2023-08-21 2 9269.92 541.33 M826s A186171 11000.00 Books

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