Physical principles of electron microscopy [2nd ed.] [Perpetual access] (Record no. 565138)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 01981 a2200229 4500 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | OSt |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9783319398778 |
| 040 ## - CATALOGING SOURCE | |
| Transcribing agency | IIT Kanpur |
| 041 ## - LANGUAGE CODE | |
| Language code of text/sound track or separate title | eng |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 502.825 |
| Item number | Eg26p2 |
| 100 ## - MAIN ENTRY--AUTHOR NAME | |
| Personal name | R.F. Egerton |
| 245 ## - TITLE STATEMENT | |
| Title | Physical principles of electron microscopy [2nd ed.] [Perpetual access] |
| Remainder of title | an introduction to TEM, SEM, and AEM |
| Statement of responsibility, etc | R.F. Egerton |
| 250 ## - EDITION STATEMENT | |
| Edition statement | 2nd ed. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Name of publisher | Springer |
| Year of publication | 2016 |
| Place of publication | Switzerland |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | xi,196p |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc | This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth. Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes but have only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Electron microscopy |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Microscopy |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Nanotechnology |
| 856 ## - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | https://link.springer.com/book/10.1007%2F978-3-319-39877-8#about |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | E books |
| Withdrawn status | Lost status | Damaged status | Not for loan | Collection code | Permanent Location | Current Location | Date acquired | Source of acquisition | Cost, normal purchase price | Full call number | Accession Number | Cost, replacement price | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Electronic Resources | PK Kelkar Library, IIT Kanpur | PK Kelkar Library, IIT Kanpur | 2022-04-28 | 88 | 35736.26 | 502.825 Eg26p2 | EBK10737 | 35736.26 | E books |