Atomic force microscopy (Record no. 564979)
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000 -LEADER | |
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fixed length control field | 01434 a2200181 4500 |
003 - CONTROL NUMBER IDENTIFIER | |
control field | OSt |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
ISBN | 9780367218645 |
040 ## - CATALOGING SOURCE | |
Transcribing agency | IIT Kanpur |
041 ## - LANGUAGE CODE | |
Language code of text/sound track or separate title | eng |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 570.282 |
Item number | Sa56a |
100 ## - MAIN ENTRY--AUTHOR NAME | |
Personal name | Sanders, Wesley C. |
245 ## - TITLE STATEMENT | |
Title | Atomic force microscopy |
Remainder of title | fundamental concepts and laboratory investigations |
Statement of responsibility, etc | Wesley C. Sanders |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
Name of publisher | CRC Press |
Year of publication | 2020 |
Place of publication | Boca Raton |
300 ## - PHYSICAL DESCRIPTION | |
Number of Pages | xiii, 139p |
520 ## - SUMMARY, ETC. | |
Summary, etc | This book focuses primarily on the atomic force microscope and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester-long introductory course in atomic force microscopy. There are a few algebra-based mathematical relationships included in the book that describe the mechanical properties, behaviors, and intermolecular forces associated with probes used in atomic force microscopy. Relevant figures, tables, and illustrations also appear in each chapter in an effort to provide additional information and points of interest. This book includes suggested laboratory investigations that provide opportunities to explore the versatility of the atomic force microscope. These laboratory exercises include opportunities for experimenters to explore force curves, surface roughness, friction loops, conductivity imaging, and phase imaging. |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical Term | Atomic force microscopy |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | Books |
Withdrawn status | Lost status | Damaged status | Not for loan | Collection code | Permanent Location | Current Location | Date acquired | Source of acquisition | Cost, normal purchase price | Full call number | Accession Number | Cost, replacement price | Koha item type |
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General Stacks | PK Kelkar Library, IIT Kanpur | PK Kelkar Library, IIT Kanpur | 2021-12-06 | 2 | 4778.08 | 570.282 Sa56a | A185400 | 5972.60 | Books |