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02484 a2200277 4500 |
| 003 - CONTROL NUMBER IDENTIFIER |
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| control field |
OSt |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
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| control field |
20210707093424.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
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210204b xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| ISBN |
9781461502159 |
| 040 ## - CATALOGING SOURCE |
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| Transcribing agency |
IIT Kanpur |
| 041 ## - LANGUAGE CODE |
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| Language code of text/sound track or separate title |
eng |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
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| Classification number |
550 |
| Item number |
Sca6e3 |
| 245 ## - TITLE STATEMENT |
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| Title |
Scanning electron microscopy and x-ray microanalysis [3rd ed.] [Perpetual] |
| Statement of responsibility, etc |
Joseph I. Goldstein ...[et al.] |
| 250 ## - EDITION STATEMENT |
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| Edition statement |
3rd ed. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
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| Name of publisher |
Springer |
| Year of publication |
2003 |
| Place of publication |
New York |
| 300 ## - PHYSICAL DESCRIPTION |
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| Number of Pages |
xix, 708p |
| 520 ## - SUMMARY, ETC. |
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| Summary, etc |
In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) analysis of specimens at the micrometer scale through electron backscatter diffr- tion (EBSD). Low-voltage operation below 5 kV has improved x-ray spatial resolution by more than an order of magnitude and provided an effective route to minimizing sample charging. High-resolution imaging has cont- ued to develop with a more thorough understanding of how secondary el- trons are generated. The ?eld emission gun SEM, with its high brightness, advanced electron optics, which minimizes lens aberrations to yield an - fective nanometer-scale beam, and “through-the-lens” detector to enhance the measurement of primary-beam-excited secondary electrons, has made high-resolution imaging the rule rather than the exception. Methods of x-ray analysis have evolved allowing for better measurement of specimens with complex morphology: multiple thin layers of different compositions, and rough specimens and particles. Digital mapping has transformed classic x-ray area scanning, a purely qualitative technique, into fully quantitative compositional mapping. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical Term |
Scanning electron microscopy |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical Term |
X-ray microanalysis |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
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| Personal name |
Goldstein, Joseph I. |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
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| Personal name |
Newbury, Dale E. |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
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| Personal name |
Echlin, Patrick |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
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| Personal name |
Lyman, Charles E. |
| 856 ## - ELECTRONIC LOCATION AND ACCESS |
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| Uniform Resource Identifier |
https://link.springer.com/book/10.1007/978-1-4615-0215-9 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
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| Koha item type |
E books |
