| 000 -LEADER |
|---|
| fixed length control field |
05068nam a2200769 i 4500 |
| 001 - CONTROL NUMBER |
|---|
| control field |
7863695 |
| 003 - CONTROL NUMBER IDENTIFIER |
|---|
| control field |
IEEE |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
|---|
| control field |
20200413152923.0 |
| 006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS |
|---|
| fixed length control field |
m eo d |
| 007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION |
|---|
| fixed length control field |
cr cn |||m|||a |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
170224s2017 caua foab 000 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9781627056915 |
| Qualifying information |
ebook |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| Canceled/invalid ISBN |
9781627056960 |
| Qualifying information |
print |
| 024 7# - OTHER STANDARD IDENTIFIER |
|---|
| Standard number or code |
10.2200/S00750ED1V01Y201701EET009 |
| Source of number or code |
doi |
| 035 ## - SYSTEM CONTROL NUMBER |
|---|
| System control number |
(CaBNVSL)swl00407142 |
| 035 ## - SYSTEM CONTROL NUMBER |
|---|
| System control number |
(OCoLC)973736486 |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
CaBNVSL |
| Language of cataloging |
eng |
| Description conventions |
rda |
| Transcribing agency |
CaBNVSL |
| Modifying agency |
CaBNVSL |
| 050 #4 - LIBRARY OF CONGRESS CALL NUMBER |
|---|
| Classification number |
TK8315 |
| Item number |
.A727 2017 |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
621.367 |
| Edition number |
23 |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Arai, Yasuo, |
| Relator term |
author. |
| 245 10 - TITLE STATEMENT |
|---|
| Title |
Radiation imaging detectors using SOI technology / |
| Statement of responsibility, etc. |
Yasuo Arai and Ikuo Kurachi. |
| 264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE |
|---|
| Place of production, publication, distribution, manufacture |
[San Rafael, California] : |
| Name of producer, publisher, distributor, manufacturer |
Morgan & Claypool, |
| Date of production, publication, distribution, manufacture, or copyright notice |
2017. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
1 PDF (xi, 59 pages) : |
| Other physical details |
illustrations. |
| 336 ## - CONTENT TYPE |
|---|
| Content type term |
text |
| Source |
rdacontent |
| 337 ## - MEDIA TYPE |
|---|
| Media type term |
electronic |
| Source |
isbdmedia |
| 338 ## - CARRIER TYPE |
|---|
| Carrier type term |
online resource |
| Source |
rdacarrier |
| 490 1# - SERIES STATEMENT |
|---|
| Series statement |
Synthesis lectures on emerging engineering technologies, |
| International Standard Serial Number |
2381-1439 ; |
| Volume/sequential designation |
# 9 |
| 538 ## - SYSTEM DETAILS NOTE |
|---|
| System details note |
Mode of access: World Wide Web. |
| 538 ## - SYSTEM DETAILS NOTE |
|---|
| System details note |
System requirements: Adobe Acrobat Reader. |
| 500 ## - GENERAL NOTE |
|---|
| General note |
Part of: Synthesis digital library of engineering and computer science. |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
|---|
| Bibliography, etc. note |
Includes bibliographical references (pages 51-58). |
| 505 0# - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
1. Introduction -- |
| 505 8# - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
2. Major issues in SOI pixel detector -- 2.1 Back-gate effect -- 2.2 Crosstalk between sensors and circuits -- 2.3 Leakage current -- 2.4 High-resistivity wafer -- 2.5 Radiation hardness -- |
| 505 8# - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
3. Basic SOI pixel process -- 3.1 Advantages of SOI structure -- 3.2 FD-SOI radiation sensor fabrication process -- 3.2.1 FZ wafer utilization for handle wafer -- 3.2.2 p-n junction diode and contact -- 3.2.3 Well formation in handle wafer -- |
| 505 8# - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
4. Radiation hardness improvements -- 4.1 FD-SOI radiation hardness -- 4.2 Cause of nMOSFET drain current change -- 4.3 Cause of p-MOSFET drain current change -- 4.4 Improvement of p-MOSFET radiation hardness -- |
| 505 8# - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
5. Advanced process developments -- 5.1 Double SOI -- 5.2 Stitching -- 5.3 Back-gate pinned SOI pixel -- 5.4 3D vertical integration -- 5.5 Super-steep subthreshold slope transistor -- |
| 505 8# - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
6. Detector research and developments -- 6.1 Integration type pixel -- 6.2 Counting-type pixel (CNTPIX) -- 6.3 X-ray detector for astrophysics (XRPIX) -- 6.4 Vertex detector for charged particles (PIXOR) -- 6.5 XFEL detector (SOPHIAS) -- 6.6 Fermilab SOI CMOS detector (MAMBO) -- 6.7 LBNL SOI-imager -- 6.8 Ultra-low temperature applications -- 6.9 Readout board (SEABAS) -- |
| 505 8# - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
7. Summary -- Bibliography -- Authors' biographies. |
| 506 1# - RESTRICTIONS ON ACCESS NOTE |
|---|
| Terms governing access |
Abstract freely available; full-text restricted to subscribers or individual document purchasers. |
| 510 0# - CITATION/REFERENCES NOTE |
|---|
| Name of source |
Compendex |
| 510 0# - CITATION/REFERENCES NOTE |
|---|
| Name of source |
INSPEC |
| 510 0# - CITATION/REFERENCES NOTE |
|---|
| Name of source |
Google scholar |
| 510 0# - CITATION/REFERENCES NOTE |
|---|
| Name of source |
Google book search |
| 520 3# - SUMMARY, ETC. |
|---|
| Summary, etc. |
Silicon-on-Insulator (SOI) technology is widely used in high-performance and low-power semiconductor devices. The SOI wafers have two layers of active silicon (Si), and normally the bottom Si layer is a mere physical structure. The idea of making intelligent pixel detectors by using the bottom Si layer as sensors for X-ray, infrared light, high-energy particles, neutrons, etc. emerged from very early days of the SOI technology. However, there have been several difficult issues with fabricating such detectors and they have not become very popular until recently. This book offers a comprehensive overview of the basic concepts and research issues of SOI radiation image detectors. It introduces basic issues to implement the SOI detector and presents how to solve these issues. It also reveals fundamental techniques, improvement of radiation tolerance, applications, and examples of the detectors. Since the SOI detector has both a thick sensing region and CMOS transistors in a monolithic die, many ideas have emerged to utilize this technology. This book is a good introduction for people who want to develop or use SOI detectors. |
| 530 ## - ADDITIONAL PHYSICAL FORM AVAILABLE NOTE |
|---|
| Additional physical form available note |
Also available in print. |
| 588 ## - SOURCE OF DESCRIPTION NOTE |
|---|
| Source of description note |
Title from PDF title page (viewed on February 24, 2017). |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Silicon-on-insulator technology. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Imaging systems |
| General subdivision |
Design and construction. |
| 653 ## - INDEX TERM--UNCONTROLLED |
|---|
| Uncontrolled term |
radiation image sensor |
| 653 ## - INDEX TERM--UNCONTROLLED |
|---|
| Uncontrolled term |
silicon-on-insulator |
| 653 ## - INDEX TERM--UNCONTROLLED |
|---|
| Uncontrolled term |
SOI |
| 653 ## - INDEX TERM--UNCONTROLLED |
|---|
| Uncontrolled term |
X-ray diffraction |
| 653 ## - INDEX TERM--UNCONTROLLED |
|---|
| Uncontrolled term |
X-ray imaging |
| 653 ## - INDEX TERM--UNCONTROLLED |
|---|
| Uncontrolled term |
X-ray astronomy |
| 653 ## - INDEX TERM--UNCONTROLLED |
|---|
| Uncontrolled term |
high-energy particle physics |
| 653 ## - INDEX TERM--UNCONTROLLED |
|---|
| Uncontrolled term |
synchrotron radiation |
| 653 ## - INDEX TERM--UNCONTROLLED |
|---|
| Uncontrolled term |
pixel detector |
| 653 ## - INDEX TERM--UNCONTROLLED |
|---|
| Uncontrolled term |
CMOS |
| 653 ## - INDEX TERM--UNCONTROLLED |
|---|
| Uncontrolled term |
radiation tolerance |
| 653 ## - INDEX TERM--UNCONTROLLED |
|---|
| Uncontrolled term |
monolithic sensor |
| 653 ## - INDEX TERM--UNCONTROLLED |
|---|
| Uncontrolled term |
particle detector |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Kurachi, Ikuo, |
| Relator term |
author. |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
|---|
| Relationship information |
Print version: |
| International Standard Book Number |
9781627056960 |
| 830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE |
|---|
| Uniform title |
Synthesis digital library of engineering and computer science. |
| 830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE |
|---|
| Uniform title |
Synthesis lectures on emerging engineering technologies ; |
| Volume/sequential designation |
# 9. |
| International Standard Serial Number |
2381-1439 |
| 856 42 - ELECTRONIC LOCATION AND ACCESS |
|---|
| Materials specified |
Abstract with links to resource |
| Uniform Resource Identifier |
http://ieeexplore.ieee.org/servlet/opac?bknumber=7863695 |
