Kelvin probe force microscopy (Record no. 559760)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 01666 a2200253 4500 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20181112105848.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 181112b xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9783319756868 |
| 040 ## - CATALOGING SOURCE | |
| Transcribing agency | IIT Kanpur |
| 041 ## - LANGUAGE CODE | |
| Language code of text/sound track or separate title | eng |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 502.825 |
| Item number | K299 |
| 245 ## - TITLE STATEMENT | |
| Title | Kelvin probe force microscopy |
| Remainder of title | from single charge detection to device characterization |
| Statement of responsibility, etc | edited by Sascha Sadewasser and Thilo Glatzel |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Name of publisher | Springer |
| Year of publication | 2018 |
| Place of publication | Switzerland |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | xxiv, 521p |
| 440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE | |
| Title | Springer series in surface sciences |
| 490 ## - SERIES STATEMENT | |
| Series statement | / edited by Roberto Car; v.65 |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc | This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors’ previous volume “Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,” presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Atomic force microscopy |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Thermodynamics |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Engineering |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Glatzel, Thilo [ed.] |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Sadewasser, Sascha [ed.] |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Books |
| Withdrawn status | Lost status | Damaged status | Not for loan | Collection code | Permanent Location | Current Location | Date acquired | Source of acquisition | Cost, normal purchase price | Full call number | Accession Number | Cost, replacement price | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| General Stacks | PK Kelkar Library, IIT Kanpur | PK Kelkar Library, IIT Kanpur | 2018-11-05 | 2 | 9372.61 | 502.825 K299 | A183980 | 11715.76 | Books |