Spectroscopy of complex oxide interfaces (Record no. 559746)
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000 -LEADER | |
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fixed length control field | 01905 a2200229 4500 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
ISBN | 9783319749884 |
040 ## - CATALOGING SOURCE | |
Transcribing agency | IIT Kanpur |
041 ## - LANGUAGE CODE | |
Language code of text/sound track or separate title | eng |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 535.84 |
Item number | Sp31 |
245 ## - TITLE STATEMENT | |
Title | Spectroscopy of complex oxide interfaces |
Remainder of title | photoemission and related spectroscopies |
Statement of responsibility, etc | edited by Claudia Cancellieri and Vladimir N. Strocov |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
Name of publisher | Springer |
Year of publication | 2018 |
Place of publication | Switzerland |
300 ## - PHYSICAL DESCRIPTION | |
Number of Pages | xiv, 320p |
440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE | |
Title | Springer series in materials science / edited by Robert Hull |
490 ## - SERIES STATEMENT | |
Series statement | v. 266 |
520 ## - SUMMARY, ETC. | |
Summary, etc | This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces. The crucial feature of exploring buried interfaces is the use of soft X-ray angle-resolved photoemission spectroscopy (ARPES) operating on the energy range of a few hundred eV to increase the photoelectron mean free path, enabling the photons to penetrate through the top layers – in contrast to conventional ultraviolet (UV)-ARPES techniques. The results presented here, achieved by different research groups around the world, are summarized in a clearly structured way and discussed in comparison with other photoemission spectroscopy techniques and other oxide materials. They are complemented and supported by the most recent theoretical calculations as well as results of complementary experimental techniques including electron transport and inelastic resonant X-ray scattering. |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical Term | Spectrum analysis |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical Term | Photoemission |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical Term | Spectroscopy and microscopy |
700 ## - ADDED ENTRY--PERSONAL NAME | |
Personal name | Cancellieri, Claudia [ed.] |
700 ## - ADDED ENTRY--PERSONAL NAME | |
Personal name | Strocov, Vladimir N. [ed.] |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | Books |
Withdrawn status | Lost status | Damaged status | Not for loan | Collection code | Permanent Location | Current Location | Date acquired | Source of acquisition | Cost, normal purchase price | Full call number | Accession Number | Cost, replacement price | Koha item type |
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General Stacks | PK Kelkar Library, IIT Kanpur | PK Kelkar Library, IIT Kanpur | 2018-10-25 | 2 | 10135.73 | 535.84 Sp31 | A183956 | 12669.66 | Books |