Super–resolution microscopy (Record no. 558040)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 02335 a2200181 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 170929b xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9783527341337 |
| 040 ## - CATALOGING SOURCE | |
| Transcribing agency | IITK |
| 041 ## - LANGUAGE CODE | |
| Language code of text/sound track or separate title | eng |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 540 |
| Item number | B534s |
| 100 ## - MAIN ENTRY--AUTHOR NAME | |
| Personal name | Birk, Udo J. |
| 245 ## - TITLE STATEMENT | |
| Title | Super–resolution microscopy |
| Remainder of title | a practical guide |
| Statement of responsibility, etc | Udo J. Birk |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Name of publisher | Wiley VCH |
| Year of publication | 2017 |
| Place of publication | Weinheim |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | xvii, 387p |
| 505 ## - FORMATTED CONTENTS NOTE | |
| Formatted contents note | This unique book on super–resolution microscopy techniques presents comparative, in–depth analyses of the strengths and weaknesses of the individual approaches. It was written for non–experts who need to understand the principles of super–resolution or who wish to use recently commercialized instruments as well as for professionals who plan to realize novel microscopic devices. Explaining the practical requirements in terms of hardware, software and sample preparation, the book offers a wealth of hands–on tips and practical tricks to get a setup running, provides invaluable help and support for successful data acquisition and specific advice in the context of data analysis and visualization. Furthermore, it addresses a wide array of transdisciplinary fields of applications. The author begins by outlining the joint efforts that have led to achieving super–resolution microscopy combining advances in single–molecule photo–physics, fluorophore design and fluorescent labeling, instrument design and software development. The following chapters depict and compare current main standard techniques such as structured illumination microscopy, single–molecule localization, stimulated emission depletion microscopy and multi–scale imaging including light–sheet and expansion microscopy. For each individual approach the experimental setups are introduced, the imaging protocols are provided and the various applications illustrated. The book concludes with a discussion of future challenges addressing issues of routine applications and further commercialization of the available methods. Guiding users in how to make choices for the design of their own experiments from scratch to promising application, this one–stop resource is intended for researchers in the applied sciences, from chemistry to biology and medicine to physics and engineering. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Electron microscopy |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Books |
| Withdrawn status | Lost status | Damaged status | Not for loan | Collection code | Permanent Location | Current Location | Date acquired | Source of acquisition | Cost, normal purchase price | Full call number | Accession Number | Cost, replacement price | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| General Stacks | PK Kelkar Library, IIT Kanpur | PK Kelkar Library, IIT Kanpur | 2017-09-29 | 2 | 6614.66 | 540 B534s | A183232 | 8819.55 | Books |