000 -LEADER |
fixed length control field |
05100nam a22006015i 4500 |
001 - CONTROL NUMBER |
control field |
978-3-540-74083-4 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
DE-He213 |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20161121231145.0 |
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION |
fixed length control field |
cr nn 008mamaa |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
100301s2008 gw | s |||| 0|eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9783540740834 |
-- |
978-3-540-74083-4 |
024 7# - OTHER STANDARD IDENTIFIER |
Standard number or code |
10.1007/978-3-540-74083-4 |
Source of number or code |
doi |
050 #4 - LIBRARY OF CONGRESS CALL NUMBER |
Classification number |
T174.7 |
072 #7 - SUBJECT CATEGORY CODE |
Subject category code |
TDPB |
Source |
bicssc |
072 #7 - SUBJECT CATEGORY CODE |
Subject category code |
TEC027000 |
Source |
bisacsh |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
620.5 |
Edition number |
23 |
245 10 - TITLE STATEMENT |
Title |
Applied Scanning Probe Methods IX |
Medium |
[electronic resource] : |
Remainder of title |
Characterization / |
Statement of responsibility, etc. |
edited by Masahiko Tomitori, Bharat Bhushan, Harald Fuchs. |
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE |
Place of production, publication, distribution, manufacture |
Berlin, Heidelberg : |
Name of producer, publisher, distributor, manufacturer |
Springer Berlin Heidelberg, |
Date of production, publication, distribution, manufacture, or copyright notice |
2008. |
300 ## - PHYSICAL DESCRIPTION |
Extent |
LIX, 387 p. |
Other physical details |
online resource. |
336 ## - CONTENT TYPE |
Content type term |
text |
Content type code |
txt |
Source |
rdacontent |
337 ## - MEDIA TYPE |
Media type term |
computer |
Media type code |
c |
Source |
rdamedia |
338 ## - CARRIER TYPE |
Carrier type term |
online resource |
Carrier type code |
cr |
Source |
rdacarrier |
347 ## - DIGITAL FILE CHARACTERISTICS |
File type |
text file |
Encoding format |
PDF |
Source |
rda |
490 1# - SERIES STATEMENT |
Series statement |
Nano Science and Technolgy, |
International Standard Serial Number |
1434-4904 |
505 0# - FORMATTED CONTENTS NOTE |
Formatted contents note |
Ultrathin Fullerene-Based Films via STM and STS -- Quantitative Measurement of Materials Properties with the (Digital) Pulsed Force Mode -- Advances in SPMs for Investigation and Modification of Solid-Supported Monolayers -- Atomic Force Microscopy Studies of the Mechanical Properties of Living Cells -- Towards a Nanoscale View of Microbial Surfaces Using the Atomic Force Microscope -- Cellular Physiology of Epithelium and Endothelium -- Application of Atomic Force Microscopy to the Study of Expressed Molecules in or on a Single Living Cell -- What Can Atomic Force Microscopy Say About Amyloid Aggregates? -- Atomic Force Microscopy: Interaction Forces Measured in Phospholipid Monolayers, Bilayers and Cell Membranes -- Self-Assembled Monolayers on Aluminum and Copper Oxide Surfaces: Surface and Interface Characteristics, Nanotribological Properties, and Chemical Stability -- High Sliding Velocity Nanotribological Investigations of Materials for Nanotechnology Applications -- Measurement of the Mechanical Properties of One-Dimensional Polymer Nanostructures by AFM -- Evaluating Tribological Properties of Materials for Total Joint Replacements Using Scanning Probe Microscopy -- Near-Field Optical Spectroscopy of Single Quantum Constituents. |
520 ## - SUMMARY, ETC. |
Summary, etc. |
The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical properties ofpolymernanostructures, technical polymers, and near eld optics. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Engineering. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Polymers. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Surfaces (Physics). |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Interfaces (Physical sciences). |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Thin films. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Spectroscopy. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Microscopy. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Nanotechnology. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Materials |
General subdivision |
Surfaces. |
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Engineering. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Nanotechnology and Microengineering. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Spectroscopy and Microscopy. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Surface and Interface Science, Thin Films. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Nanotechnology. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Surfaces and Interfaces, Thin Films. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Polymer Sciences. |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Tomitori, Masahiko. |
Relator term |
editor. |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Bhushan, Bharat. |
Relator term |
editor. |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Fuchs, Harald. |
Relator term |
editor. |
710 2# - ADDED ENTRY--CORPORATE NAME |
Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
773 0# - HOST ITEM ENTRY |
Title |
Springer eBooks |
776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
Relationship information |
Printed edition: |
International Standard Book Number |
9783540740827 |
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE |
Uniform title |
Nano Science and Technolgy, |
International Standard Serial Number |
1434-4904 |
856 40 - ELECTRONIC LOCATION AND ACCESS |
Uniform Resource Identifier |
http://dx.doi.org/10.1007/978-3-540-74083-4 |
912 ## - |
-- |
ZDB-2-CMS |