000 -LEADER |
fixed length control field |
04314nam a22006015i 4500 |
001 - CONTROL NUMBER |
control field |
978-3-540-37316-2 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
DE-He213 |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20161121231141.0 |
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION |
fixed length control field |
cr nn 008mamaa |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
100301s2007 gw | s |||| 0|eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9783540373162 |
-- |
978-3-540-37316-2 |
024 7# - OTHER STANDARD IDENTIFIER |
Standard number or code |
10.1007/978-3-540-37316-2 |
Source of number or code |
doi |
050 #4 - LIBRARY OF CONGRESS CALL NUMBER |
Classification number |
T174.7 |
072 #7 - SUBJECT CATEGORY CODE |
Subject category code |
TDPB |
Source |
bicssc |
072 #7 - SUBJECT CATEGORY CODE |
Subject category code |
TEC027000 |
Source |
bisacsh |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
620.5 |
Edition number |
23 |
245 10 - TITLE STATEMENT |
Title |
Applied Scanning Probe Methods V |
Medium |
[electronic resource] : |
Remainder of title |
Scanning Probe Microscopy Techniques / |
Statement of responsibility, etc. |
edited by Bharat Bhushan, Satoshi Kawata, Harald Fuchs. |
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE |
Place of production, publication, distribution, manufacture |
Berlin, Heidelberg : |
Name of producer, publisher, distributor, manufacturer |
Springer Berlin Heidelberg, |
Date of production, publication, distribution, manufacture, or copyright notice |
2007. |
300 ## - PHYSICAL DESCRIPTION |
Extent |
XLV, 344 p. |
Other physical details |
online resource. |
336 ## - CONTENT TYPE |
Content type term |
text |
Content type code |
txt |
Source |
rdacontent |
337 ## - MEDIA TYPE |
Media type term |
computer |
Media type code |
c |
Source |
rdamedia |
338 ## - CARRIER TYPE |
Carrier type term |
online resource |
Carrier type code |
cr |
Source |
rdacarrier |
347 ## - DIGITAL FILE CHARACTERISTICS |
File type |
text file |
Encoding format |
PDF |
Source |
rda |
490 1# - SERIES STATEMENT |
Series statement |
NanoScience and Technology, |
International Standard Serial Number |
1434-4904 |
505 0# - FORMATTED CONTENTS NOTE |
Formatted contents note |
Integrated Cantilevers and Atomic Force Microscopes -- Electrostatic Microscanner -- Low-Noise Methods for Optical Measurements of Cantilever Deflections -- Q-controlled Dynamic Force Microscopy in Air and Liquids -- High-Frequency Dynamic Force Microscopy -- Torsional Resonance Microscopy and Its Applications -- Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy -- Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale -- New AFM Developments to Study Elasticity and Adhesion at the Nanoscale -- Near-Field Raman Spectroscopy and Imaging. |
520 ## - SUMMARY, ETC. |
Summary, etc. |
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Engineering. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Polymers. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Surfaces (Physics). |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Interfaces (Physical sciences). |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Thin films. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Spectroscopy. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Microscopy. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Nanotechnology. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Materials |
General subdivision |
Surfaces. |
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Engineering. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Nanotechnology and Microengineering. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Spectroscopy and Microscopy. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Surface and Interface Science, Thin Films. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Nanotechnology. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Surfaces and Interfaces, Thin Films. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Polymer Sciences. |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Bhushan, Bharat. |
Relator term |
editor. |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Kawata, Satoshi. |
Relator term |
editor. |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Fuchs, Harald. |
Relator term |
editor. |
710 2# - ADDED ENTRY--CORPORATE NAME |
Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
773 0# - HOST ITEM ENTRY |
Title |
Springer eBooks |
776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
Relationship information |
Printed edition: |
International Standard Book Number |
9783540373155 |
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE |
Uniform title |
NanoScience and Technology, |
International Standard Serial Number |
1434-4904 |
856 40 - ELECTRONIC LOCATION AND ACCESS |
Uniform Resource Identifier |
http://dx.doi.org/10.1007/978-3-540-37316-2 |
912 ## - |
-- |
ZDB-2-CMS |