000 -LEADER |
fixed length control field |
04202nam a22004815i 4500 |
001 - CONTROL NUMBER |
control field |
978-1-4020-8006-7 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
DE-He213 |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20161121231100.0 |
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION |
fixed length control field |
cr nn 008mamaa |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
100301s2005 xxu| s |||| 0|eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9781402080067 |
-- |
978-1-4020-8006-7 |
024 7# - OTHER STANDARD IDENTIFIER |
Standard number or code |
10.1007/1-4020-8006-9 |
Source of number or code |
doi |
050 #4 - LIBRARY OF CONGRESS CALL NUMBER |
Classification number |
TA404.6 |
072 #7 - SUBJECT CATEGORY CODE |
Subject category code |
TGMT |
Source |
bicssc |
072 #7 - SUBJECT CATEGORY CODE |
Subject category code |
TEC021000 |
Source |
bisacsh |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
620.11 |
Edition number |
23 |
245 10 - TITLE STATEMENT |
Title |
Handbook of Microscopy for Nanotechnology |
Medium |
[electronic resource] / |
Statement of responsibility, etc. |
edited by Nan Yao, Zhong Lin Wang. |
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE |
Place of production, publication, distribution, manufacture |
Boston, MA : |
Name of producer, publisher, distributor, manufacturer |
Springer US, |
Date of production, publication, distribution, manufacture, or copyright notice |
2005. |
300 ## - PHYSICAL DESCRIPTION |
Extent |
XX, 731 p. |
Other physical details |
online resource. |
336 ## - CONTENT TYPE |
Content type term |
text |
Content type code |
txt |
Source |
rdacontent |
337 ## - MEDIA TYPE |
Media type term |
computer |
Media type code |
c |
Source |
rdamedia |
338 ## - CARRIER TYPE |
Carrier type term |
online resource |
Carrier type code |
cr |
Source |
rdacarrier |
347 ## - DIGITAL FILE CHARACTERISTICS |
File type |
text file |
Encoding format |
PDF |
Source |
rda |
505 0# - FORMATTED CONTENTS NOTE |
Formatted contents note |
Optical Microscopy, Scanning Probe Microscopy, Ion Microscopy and Nanofabrication -- Confocal Scanning Optical Microscopy and Nanotechnology -- Scanning Near-Field Optical Microscopy in Nanosciences -- Scanning Tunneling Microscopy -- Visualization of Nanostructures with Atomic Force Microscopy -- Scanning Probe Microscopy for Nanoscale Manipulation and Patterning -- Scanning Thermal and Thermoelectric Microscopy -- Imaging Secondary Ion Mass Spectrometry -- Atom Probe Tomography -- Focused Ion Beam System—a Multifunctional Tool for Nanotechnology -- Electron Beam Lithography -- Electron Microscopy -- High-Resolution Scanning Electron Microscopy -- High Spatial Resolution Quantitative Electron Beam Microanalysis for Nanoscale Materials -- Characterization of Nano-Crystalline Materials Using Electron Backscatter Diffraction in the Scanning Electron Microscope -- High Resolution Transmission Electron Microscopy -- Scanning Transmission Electron Microscopy -- In-Situ Electron Microscopy for Nanomeasurements -- Environmental Transmission Electron Microscopy in Nanotechnology -- Electron Nanocrystallography -- Tomography Using the Transmission Electron Microscope -- Off-Axis Electron Holography -- SUB-NM Spatially Resolved Electron Energy-Loss Spectroscopy -- Imaging Magnetic Structures Using TEM. |
520 ## - SUMMARY, ETC. |
Summary, etc. |
Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Materials science. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Analytical chemistry. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Condensed matter. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Nanotechnology. |
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Materials Science. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Characterization and Evaluation of Materials. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Nanotechnology. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Condensed Matter Physics. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Analytical Chemistry. |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Yao, Nan. |
Relator term |
editor. |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Wang, Zhong Lin. |
Relator term |
editor. |
710 2# - ADDED ENTRY--CORPORATE NAME |
Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
773 0# - HOST ITEM ENTRY |
Title |
Springer eBooks |
776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
Relationship information |
Printed edition: |
International Standard Book Number |
9781402080036 |
856 40 - ELECTRONIC LOCATION AND ACCESS |
Uniform Resource Identifier |
http://dx.doi.org/10.1007/1-4020-8006-9 |
912 ## - |
-- |
ZDB-2-CMS |