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Handbook of Microscopy for Nanotechnology (Record no. 508289)

000 -LEADER
fixed length control field 04202nam a22004815i 4500
001 - CONTROL NUMBER
control field 978-1-4020-8006-7
003 - CONTROL NUMBER IDENTIFIER
control field DE-He213
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20161121231100.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 100301s2005 xxu| s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781402080067
-- 978-1-4020-8006-7
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1007/1-4020-8006-9
Source of number or code doi
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TA404.6
072 #7 - SUBJECT CATEGORY CODE
Subject category code TGMT
Source bicssc
072 #7 - SUBJECT CATEGORY CODE
Subject category code TEC021000
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 620.11
Edition number 23
245 10 - TITLE STATEMENT
Title Handbook of Microscopy for Nanotechnology
Medium [electronic resource] /
Statement of responsibility, etc. edited by Nan Yao, Zhong Lin Wang.
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture Boston, MA :
Name of producer, publisher, distributor, manufacturer Springer US,
Date of production, publication, distribution, manufacture, or copyright notice 2005.
300 ## - PHYSICAL DESCRIPTION
Extent XX, 731 p.
Other physical details online resource.
336 ## - CONTENT TYPE
Content type term text
Content type code txt
Source rdacontent
337 ## - MEDIA TYPE
Media type term computer
Media type code c
Source rdamedia
338 ## - CARRIER TYPE
Carrier type term online resource
Carrier type code cr
Source rdacarrier
347 ## - DIGITAL FILE CHARACTERISTICS
File type text file
Encoding format PDF
Source rda
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Optical Microscopy, Scanning Probe Microscopy, Ion Microscopy and Nanofabrication -- Confocal Scanning Optical Microscopy and Nanotechnology -- Scanning Near-Field Optical Microscopy in Nanosciences -- Scanning Tunneling Microscopy -- Visualization of Nanostructures with Atomic Force Microscopy -- Scanning Probe Microscopy for Nanoscale Manipulation and Patterning -- Scanning Thermal and Thermoelectric Microscopy -- Imaging Secondary Ion Mass Spectrometry -- Atom Probe Tomography -- Focused Ion Beam System—a Multifunctional Tool for Nanotechnology -- Electron Beam Lithography -- Electron Microscopy -- High-Resolution Scanning Electron Microscopy -- High Spatial Resolution Quantitative Electron Beam Microanalysis for Nanoscale Materials -- Characterization of Nano-Crystalline Materials Using Electron Backscatter Diffraction in the Scanning Electron Microscope -- High Resolution Transmission Electron Microscopy -- Scanning Transmission Electron Microscopy -- In-Situ Electron Microscopy for Nanomeasurements -- Environmental Transmission Electron Microscopy in Nanotechnology -- Electron Nanocrystallography -- Tomography Using the Transmission Electron Microscope -- Off-Axis Electron Holography -- SUB-NM Spatially Resolved Electron Energy-Loss Spectroscopy -- Imaging Magnetic Structures Using TEM.
520 ## - SUMMARY, ETC.
Summary, etc. Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Materials science.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Analytical chemistry.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Condensed matter.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Nanotechnology.
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Materials Science.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Characterization and Evaluation of Materials.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Nanotechnology.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Condensed Matter Physics.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Analytical Chemistry.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Yao, Nan.
Relator term editor.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Wang, Zhong Lin.
Relator term editor.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information Printed edition:
International Standard Book Number 9781402080036
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/1-4020-8006-9
912 ## -
-- ZDB-2-CMS
Holdings
Withdrawn status Lost status Damaged status Not for loan Permanent Location Current Location Date acquired Barcode Date last seen Price effective from Koha item type
        PK Kelkar Library, IIT Kanpur PK Kelkar Library, IIT Kanpur 2016-11-21 EBK8576 2016-11-21 2016-11-21 E books

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