000 -LEADER |
fixed length control field |
00794 a2200229 4500 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
3908450829 |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
621.38152 |
Item number |
IN82 |
245 1# - TITLE STATEMENT |
Title |
GETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY, GADEST 2003 |
Statement of responsibility, etc. |
INTERNATIONAL AUTUMN MEETING ON GETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY(10TH: 2003: BRANDENBURG, GERMANY |
260 ## - PUBLICATION, DISTRIBUTION, ETC. |
Place of publication, distribution, etc. |
|
Name of publisher, distributor, etc. |
Scitec Publications Ltd., Switzerland |
Date of publication, distribution, etc. |
2004 |
300 ## - PHYSICAL DESCRIPTION |
Extent |
xvi,682 |
440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE |
Title |
Solid State Phenomena, Part B Of"Diffusion And Defect Data" |
Volume/sequential designation |
|
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Semiconductors -- Congresses |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Getters -- Congresses |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Silicon Crystals -- Defects -- Congresses |
700 ## - ADDED ENTRY--PERSONAL NAME |
Personal name |
Richter,H. |
700 ## - ADDED ENTRY--PERSONAL NAME |
Personal name |
|
700 ## - ADDED ENTRY--PERSONAL NAME |
Personal name |
Kittler,M. |
700 ## - ADDED ENTRY--PERSONAL NAME |
Personal name |
|
906 ## - LOCAL DATA ELEMENT F, LDF (RLIN) |
h |
0 |
964 ## - |
-- |
CIRC |
997 ## - |
-- |
A151260 s C |