000 -LEADER |
fixed length control field |
00582 a2200205 4500 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
0873395352 |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
620.11299 |
Item number |
EL25 |
100 ## - MAIN ENTRY--PERSONAL NAME |
Personal name |
J. R. Weertman,No |
245 1# - TITLE STATEMENT |
Title |
ELECTRON MICROSCOPY |
Remainder of title |
ITS ROLE IN MATERIAL SCIENCE |
Statement of responsibility, etc. |
THE MIKE MESHII SYMPOSUIM (2003 : SAN DIEGO, CALIFORNIA) |
260 ## - PUBLICATION, DISTRIBUTION, ETC. |
Place of publication, distribution, etc. |
|
Name of publisher, distributor, etc. |
Tms Publications, Warrendale, Pa |
Date of publication, distribution, etc. |
2003 |
300 ## - PHYSICAL DESCRIPTION |
Extent |
xi,359 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Electron Microscopy |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Materials -- Microscopy |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Materials -- Analysis |
700 ## - ADDED ENTRY--PERSONAL NAME |
Personal name |
Weertman,J. R. |
700 ## - ADDED ENTRY--PERSONAL NAME |
Personal name |
|
906 ## - LOCAL DATA ELEMENT F, LDF (RLIN) |
h |
0 |
964 ## - |
-- |
NEW |
997 ## - |
-- |
A147663 C |